Facilities
|
Sample Preparation Laboratory
Buehler Isomet 1000 precision saw
Buehler Metaserv 3000 variable speed grinder Corning PC-600D digital hot plate Corning PC-620D digital stirring hot plate Branson 8510 ultrasonic cleaner Branson 1510 ultrasonic cleaner Gatan 681 high resolution ion beam coater Mettler Toledo XP203S precision balance Mettler Toledo ML3002E precision balance Nikon SMZ1000 zoom stereomicroscope Scienceware Secador desiccator cabinet Conventional fume hood Laboratory refrigerator |
TESCAN LYRA3 XMU FIB-SEM workstationHoused at the University of Alabama Alabama Analytical Research Center (AARC).
Field Emission Gun (FEG) electron beam, for normal scanning electron microscopy SEM imaging. Gallium Focused Ion Beam (FIB) column for ion beam milling and imaging samples. Equipped with 5 in situ gas injection ports, micromanipulation and nano-lithographic patterning capability, and variable pressure mode. The instrument is also equipped with an EDAX TEAM Pegasus EDS/EBSD integrated system. |
|
|
CAMECA LEAP 5000 XS
Housed at the University of Alabama Alabama Analytical Research Center (AARC).
The LEAP 5000 XS is a Local Electrode Atom Probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom-by-atom identification and accurate spatial positioning. The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample. The local electrode provides both ease of use and data quality as well as enabling the use of prefabricated Microtip arrays. Using these enables multiple analytical specimens to be prepared, mounted and loaded into the instrument for maximum efficiency with multi-user and/or multi-experiment scenarios. |
